Idaho National Laboratory uses a thermoreflectance approach to simultaneously measure thermal conductivity and diffusivity with micron-level resolution. This experimental information, in tandem with thermal transport modeling, enables connecting measured properties directly to microstructure. This supports our laboratory mission to provide new validation metrics for fundamental computational materials science models.
From cryogenic temperatures to ~700°C. Material surface must be polished.
- Uses tightly focused lasers to locally heat and map temperature field.
- Measures contact resistance (thin films; grain boundaries).
- Can image thermal anisotropy.
Work must be conducted at INL.
Name: Dr. David Hurley, Directorate Fellow
Phone: (208) 526-3666
- M. Khafizov, V. Chauhan, Y. Wang, F. Riyad, N. Hang, and D. H. Hurley, Investigation of Thermal Transport in Composites and Ion Beam Irradiated Materials for Nuclear Applications, J. Mater. Res. 32, 204 (2017).
- D. H. Hurley, R. S. Schley, M. Khafizov, B. L. Wendt, Local Measurement of Thermal Conductivity and Diffusivity, Rev. Sci. Instrum. 86, 123901 (2015).