Oak Ridge National Laboratory recently introduced the Materials Characterization Center, or MCC, which offers a broad range of state-of-the-art microscopy, spectroscopy, and other characterization techniques and services to provide insight into the structure and chemistry of materials from the µm scale to the single-atom level.
The unique suite of instruments/capabilities available in ORNL’s MCC enables a full range of microstructural characterization techniques that can be applied toward understanding materials properties, performance, and behavior.
Instruments and capabilities available in the MCC include:
Scanning Transmission Electron Microscopy (STEM)
- Electron Energy Loss Spectroscopy (EELS)
- Energy Dispersive Spectroscopy (EDS)
- Three-dimensional (3D) Electron Tomography
- In situ capabilities for heating, liquid, and gas exposures
Scanning Electron Microscopy (SEM) and Electron Probe Microanalysis (EPMA)
- Electron Beam Induced Current (EBIC)
- Electron Backscatter Diffraction
Dual-beam Focused Ion Beam (FIB-SEM)
X-ray Photoelectron Spectroscopy (XPS)
Facilities in the MCC are available for partnership with industry via Strategic Partnership Projects (SPP) and cooperative research and development agreements (CRADAs).
Name: Dr. Karren L. More