X-ray Imaging and Image Processing (Radiography and Computed Tomography)

National Laboratory: 
Oak Ridge National Laboratory
Characterization Class: 

Oak Ridge National Laboratory has expertise in processing algorithms to extract information from x-ray imaging systems, along with several x-ray radiography/computed tomography systems. ORNL’s algorithm expertise includes computed tomographic reconstruction algorithms (direct and iterative), as well as two- and three-dimensional image processing for unique inspection and metrology needs. ORNL’s computed tomography capabilities include both custom and commercial systems ranging in size and energies appropriate for a range of applications, from industrial to environmental.

Capability Bounds: 

Current x-ray imaging systems include: a custom 420-keV computed tomography system with 150 mm field of view and 260 µm resolution, a custom 80-keV computed tomography system with 50 mm field of view and 40 µm resolution, and a custom 100-keV Xradia x-ray tomography microscope with 1.2–6 mm field of view and 1.2–6 µm resolution.

Unique Aspects: 

ORNL offers computational imaging expertise with respect to radiography and computed tomography in multiple modalities (x-ray, neutron, and acoustic) in conjunction with applied image processing experience to extract information related to inspection and metrology.


X-ray systems are managed by research groups for which the systems were built or purchased, and availability is arranged through research contract mechanisms.

Single Point of Contact: 

Name: Dr. Philip Bingham
Email: binghampr@ornl.gov
Phone: 865-574-5680

  1. V. Kunc, S.W. Case, H. J. Santos-Villalobos, and S. Sumonivic, “The stiffness tensor for composities with curved discontinuous fibers,” Composites Part A: Applied Science and Manufacturing, Vol. 72, 2015.
  2. C.M. Silva, L.L. Snead, J.D. Hunn, E.D. Specht, K.A. Terrani, Y. Katoh, “Application of X-ray micro-computed tomography in the characterization of irradiated nuclear fuel and material specimens,” Journal of Microscopy 260 (2015) 163-174.
  3. P.R. Bingham and L.F. Arrowood, “Projection registration applied to nondestructive testing,” SPIE Journal of Electronic Imaging, Vol. 19, No. 3, 2010.
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