High Energy X-ray Diffraction with Crystal Plasticity Modeling, or HEXRD-CP, is a computational tool for interpreting high-energy x-ray diffraction results and characterizing individual phase properties, including critical stress and hardening parameters of dislocation slip systems. While HEXRD is a volumetric measurement technique that can be used to determine residual stresses, volume fraction, and textures of individual phases, it also can obtain the lattice distortions when used in combination with in situ tensile tests. A procedure using crystal plasticity modeling, including elastic plastic self-consistent scheme or finite element, has been established that can obtain individual phase properties, such as the critical stress and hardening parameters of existing dislocation slip systems.
The resulting phase characterizations obtained from HEXRD-CP can be used for advanced models that predict forming behavior and performance, such as fatigue and fracture failure during service, etc.
The HEXRD-CP procedure can obtain individual phase properties, which are especially difficult to directly measure.
Name: Xiaohua Hu
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